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A 2D Transconductance and Sub-threshold behavior model for triple material surrounding gate (TMSG) MOSFETs
Dhanaselvam P.S, Balamurugan N.B,
Published in Elsevier BV
2013
Volume: 44
   
Issue: 12
Pages: 1159 - 1164
Abstract
A 2D analytical model for transconductance, Sub-threshold current and Sub-threshold swing for Triple Material Surrounding Gate MOSFET (TMSG) is presented in this paper. Based on the solution of two dimensional Poisson equation, the physics based model of sub-threshold current of the device is derived. The model also includes the effect of gate oxide thickness and silicon thickness on the sub-threshold swing characteristics. Transconductance to drain current ratio of the triple material surrounding gate is calculated since it is a better criterion to access the performance of the device. The effectiveness of TMSG design was scrutinized by comparing with other triple material and dual material gate structures. Moreover the effect of technology parameter variations is also studied and proposed. This proposed model offers basic guidance for design of TMSG MOSFETs. The results of the analytical model are compared with the MEDICI simulation results thus providing validity of the proposed model. © 2013 Elsevier Ltd.
About the journal
JournalData powered by TypesetMicroelectronics Journal
PublisherData powered by TypesetElsevier BV
ISSN0026-2692
Open AccessNo