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Adaptive Low Power RTPG for BIST based test applications
John R.T, Sreekanth K.D,
Published in IEEE
Pages: 933 - 936
Power reduction during testing is an important concern in scan based tests. But methods to reduce shift power will results in test coverage loss. So a Low Power Random Test Pattern Generator (LPRTPG) is presenting to improve the tradeoff between shift power reduction and the test coverage loss. To get the required tradeoff, an adaptive type technique is utilizing where the previous test responses are given as feedback to a transition controller which is capable of generating highly correlated test patterns. The experimental results on ISCAS'89 benchmark circuits' shows efficiency of the work in terms of reduction in test power. © 2013 IEEE.
About the journal
JournalData powered by Typeset2013 International Conference on Information Communication and Embedded Systems (ICICES)
PublisherData powered by TypesetIEEE
Open Access0