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Analysis of Dimensionality Reduction Techniques on Big Data
Published in Institute of Electrical and Electronics Engineers Inc.
2020
Volume: 8
   
Pages: 54776 - 54788
Abstract
Due to digitization, a huge volume of data is being generated across several sectors such as healthcare, production, sales, IoT devices, Web, organizations. Machine learning algorithms are used to uncover patterns among the attributes of this data. Hence, they can be used to make predictions that can be used by medical practitioners and people at managerial level to make executive decisions. Not all the attributes in the datasets generated are important for training the machine learning algorithms. Some attributes might be irrelevant and some might not affect the outcome of the prediction. Ignoring or removing these irrelevant or less important attributes reduces the burden on machine learning algorithms. In this work two of the prominent dimensionality reduction techniques, Linear Discriminant Analysis (LDA) and Principal Component Analysis (PCA) are investigated on four popular Machine Learning (ML) algorithms, Decision Tree Induction, Support Vector Machine (SVM), Naive Bayes Classifier and Random Forest Classifier using publicly available Cardiotocography (CTG) dataset from University of California and Irvine Machine Learning Repository. The experimentation results prove that PCA outperforms LDA in all the measures. Also, the performance of the classifiers, Decision Tree, Random Forest examined is not affected much by using PCA and LDA.To further analyze the performance of PCA and LDA the eperimentation is carried out on Diabetic Retinopathy (DR) and Intrusion Detection System (IDS) datasets. Experimentation results prove that ML algorithms with PCA produce better results when dimensionality of the datasets is high. When dimensionality of datasets is low it is observed that the ML algorithms without dimensionality reduction yields better results. © 2013 IEEE.
About the journal
JournalData powered by TypesetIEEE Access
PublisherData powered by TypesetInstitute of Electrical and Electronics Engineers Inc.
ISSN21693536
Authors (5)