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Analytical model of drain current of strained-Si/strained-Si1-YGeY/relaxed- Si1-XGeX NMOSFETs and PMOSFETs for circuit simulation
, N. DasGupta, A. DasGupta
Published in
2006
Volume: 50
   
Issue: 3
Pages: 448 - 455
Abstract
Analytical models of drain current of strained-Si/strained-Si1-YGeY/relaxed- Si1-XGeX (X < Y) n-channel and p-channel MOSFETs are presented. The field-dependent mobility variations and velocity saturation of carriers are taken into account in these models. The drain current model of p-channel MOSFET considers carrier transport at the top heterointerface in SiGe as well as at the Si/SiO2 interface. These models have been implemented in SABER, a circuit simulator. The results from the models show excellent agreement with experimental data. © 2006 Elsevier Ltd. All rights reserved.
About the journal
JournalSolid-State Electronics
ISSN00381101