Diverse novel nanomaterials are being developed for a wide range of applications nowadays. Atomic force microscopy (AFM) assumes specific importance for the measurement of size and other related properties for such nanomaterials. The different aspects related to AFM modes of operation, nanopositioning, sensing systems as well as calibration for reliable characterization in order to meet the nanometrology requirements are discussed. The future targets in this context, set by nanometrology institutes, are also highlighted. © 2013 Metrology Society of India.

Gargi Raina

Electronics

School of Electronics Engineering

Chennai Campus

Vellore Institute of Technology (VIT) is a private university located in&nbsp;Tamil Nadu, India. Founded in 1984, as Vellore Engineering College, the institution offers 20 undergraduate, 34 postgraduate, four integrated and four research programs. It has campuses in Vellore, Amravati, Bhopal and Chennai.

VIT is one of the top ranked private universities in India according to NIRF, THE and QS Rankings.&nbsp;Govt. of India has recognized&nbsp;VIT, Vellore as an&nbsp;Institution of Eminence. This has allowed VIT to take independent quality initiatives and move up in world ranking.

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VIT University

MAPAN

Atomic Force Microscopy as a Nanometrology Tool: Some Issues and Future Targets

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Journal	Data powered by TypesetMAPAN
Publisher	Data powered by TypesetSpringer Science and Business Media LLC
ISSN	0970-3950
Open Access	0