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Proceedings Article
Automatic test case generation for programmable logic controller using function block diagramPublished in IEEE
2016
Topics: Functional block diagram (61)%61% related to the paper, Test case (61)%61% related to the paper, Simatic S5 PLC (60)%60% related to the paper, Test harness (60)%60% related to the paper and Test Management Approach (59)%59% related to the paper
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About the journal
| Journal | Data powered by Typeset2016 International Conference on Information Communication and Embedded Systems (ICICES) |
|---|---|
| Publisher | Data powered by TypesetIEEE |
| Open Access | 0 |
Authors (2)
Mani P- Automatic test case generation for programmable logic controller using function block diagram
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