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Cross-axis sensitivity reduction of a silicon MEMS piezoresistive accelerometer
, S. Das, S.K. Lahiri
Published in
Volume: 15
Issue: 4
Pages: 511 - 518
This paper presents realization of a MEMS piezoresistive single axis accelerometer using dual doped TMAH solution. The silicon micromachined structure consists of a heavy proofmass supported by four thin flexures and sandwiched between top and bottom glass plates. Boron diffused piezoresistors located near fixed points of the flexure are used for sensing the developed stress due to applied acceleration. Based on the initial results an improved design has also been considered to achieve reduced cross-axis sensitivity and nonlinearity. The fabricated sensor tested upto 13 g acceleration shows average sensitivity of 0.556 mV/g along normal to the proofmass plane. The measured cross-axis sensitivity was 3.272 μV/g for X-axis and 3.442 μV/g for Y-axis which is less than 1% of Z-axis sensitivity. Comparing two designs there was an improvement of 63% sensitivity along Y-axis for the design with flexures placed along the proofmass edges. © 2008 Springer-Verlag.
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JournalMicrosystem Technologies