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Effect of capping layer on InxGa1-xN quantum dots grown using nnad method by MOCVD
H. Song, , S.-M. Jeong, S.-H. Lee, J.-S. Kim, K.-W. Seol, D.-W. Kim, C.-R. Lee
Published in World Scientific Publishing Co. Pte Ltd
2009
Volume: 8
   
Issue: 1-2
Pages: 197 - 201
Abstract
InxGa1-xN quantum dots (QDs) were grown on GaN epitaxy using nitridation of nano-alloyed droplet (NNAD) method by metal-organic chemical vapor deposition (MOCVD) system. Before the InxGa 1-xN QDs formation, In + Ga droplets were initially formed by the flow of TMI and TMG, which acts as a nucleation seed for the QDs growth. Density of the alloy droplets was increased with the increasing flow rate; however, droplet size was scarcely changed about 100200 nm by flow rate. And In xGa1-xN QDs size can be easily changed by controlling the nitridation time or various factors. Also, the influence of GaN capping layer on the properties of InxGa1-xN QDs was discussed. © 2009 World Scientific Publishing Company.
About the journal
JournalInternational Journal of Nanoscience
PublisherWorld Scientific Publishing Co. Pte Ltd
ISSN0219581X