Sunita Nayak

Centre for Biomaterials, Cellular and Molecular Theranostics

Vellore Campus

V S Kanchana   Bhaaskaran

Electronics

School of Electronics Engineering

Chennai Campus

Fulltext

Vellore Institute of Technology (VIT) is a private university located in&nbsp;Tamil Nadu, India. Founded in 1984, as Vellore Engineering College, the institution offers 20 undergraduate, 34 postgraduate, four integrated and four research programs. It has campuses in Vellore, Amravati, Bhopal and Chennai.

VIT is one of the top ranked private universities in India according to NIRF, THE and QS Rankings.&nbsp;Govt. of India has recognized&nbsp;VIT, Vellore as an&nbsp;Institution of Eminence. This has allowed VIT to take independent quality initiatives and move up in world ranking.

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VIT University

International Journal of VLSI Design & Communication Systems

The test cost and yield improvement are the major factors in the era of rapidly growing memory density and capacity. The Error-Correcting Codes (ECC) is widely used to detect and correct errors in memories. The Cyclic codes are one such code which belongs to the class of ECC with algebraic structure. This paper describes the algorithm and the memory architecture required to implement error detection and correction using cyclic code. It also presents a brief comparison between the single error correction technique based on cyclic code and another single error correction technique with code based on Reed-Muller matrix. These results are also compared with a multiple error correction technique based on modified matrix code. The results validate that cyclic codes have 80 % and 90 % lesser area, 90 and 50 % more correction efficiency when compared to the code based on Reed-Muller matrix and modified matrix codes, respectively, and around 45 % less delay when compared to the two codes. © 2013 Springer.

Lecture Notes in Electrical Engineering Proceedings of International Conference on VLSI, Communication, Advanced Devices, Signals & Systems and Networking (VCASAN-2013)

Error Detection and Correction in Embedded Memories Using Cyclic Code

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

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Geometric effect of multiple-bit soft errors induced by cosmic ray neutrons on DRAM's

Matrix Code Based Multiple Error Correction Technique for N-Bit Memory Data

Journal	International Journal of VLSI Design & Communication Systems
Publisher	Academy and Industry Research Collaboration Center (AIRCC)
ISSN	0976-1527
Open Access	Yes