Sathyanarayanan P

Centre for Nanotechnology Research

Vellore Campus

Velmurugan V

Kannadassan D

Department of Communication Engineering

School of Electronics Engineering

Sanal A

Vellore Institute of Technology (VIT) is a private university located in&nbsp;Tamil Nadu, India. Founded in 1984, as Vellore Engineering College, the institution offers 20 undergraduate, 34 postgraduate, four integrated and four research programs. It has campuses in Vellore, Amravati, Bhopal and Chennai.

VIT is one of the top ranked private universities in India according to NIRF, THE and QS Rankings.&nbsp;Govt. of India has recognized&nbsp;VIT, Vellore as an&nbsp;Institution of Eminence. This has allowed VIT to take independent quality initiatives and move up in world ranking.

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VIT University

Journal of Computational Electronics

Voltage nonlinearity is a crucial performance parameter of MIM capacitors for RF, analog and mixed signal IC applications. In present work, the fabrication and characterization of anodic high-k MIM capacitors are reported in detail and modeling of nonlinearity coefficient of capacitance is developed using polarization of induced dipoles. The model agrees with experimental results for various high-k dielectric MIM capacitors. It explores the origin of nonlinearity in capacitance–voltage characteristics of MIM capacitors and also predicts the potential requirements to meet the ITRS requirements.

Fulltext

Solid-State Electronics

Modeling the voltage nonlinearity of high-k MIM capacitors

IEEE Transactions on Circuits and Systems II: Express Briefs

A Distortion Cancelation Technique With the Recursive DFT Method for Successive Approximation Analog-to-Digital Converters

IEEE Electron Device Letters

MIM Capacitors Based on ${m ZrTiO}_{m x}/{m BaZr}_{m y}{m Ti}_{m 1-y}{m O}_{3}$ Featuring Record-Low VCC and Excellent Reliability

Optik

A general review on the derivation of Clausius–Mossotti relation

Capacitance Analysis of Highly Leaky $hbox{Al}_{2} hbox{O}_{3}$ MIM Capacitors Using Time Domain Reflectometry

Negative VCC in MIM capacitors: modeling and experiments

Journal	Data powered by TypesetJournal of Computational Electronics
Publisher	Data powered by TypesetSpringer Science and Business Media LLC
ISSN	1569-8025
Open Access	0