The InN phase is grown in crystalline InP(100) substrates by 50 keV N+ implantation at an elevated temperature of 400 °C followed by annealing at 525 °C in N2 ambient. Crystallographic structural and Raman scattering studies are performed for the characterization of grown phases. Temperature- and power-dependent photoluminescence studies show direct band-to-band transition peak ∼1.06 eV at temperatures ≤150 K. Implantations at an elevated temperature with a low ion beam current and subsequent low temperature annealing step are found responsible for the growth of high-quality InN phase. © 2006 American Institute of Physics.