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Effect of air annealing on structure and magnetic properties of Sn1-xFexO2 thin films
, Begam M.R, Babu S.H, , Rao N.M,
Published in Author(s)
2016
Volume: 1731
   
Abstract
Sn1-xFexO2 (x = 0.07) thin films were prepared on to glass substrates using flash evaporation technique and annealed in air at different temperatures. The X-ray diffraction study showsed that all the thin films annealed at different temperatures were in tetragonal rutile structure of SnO2. The Elemental analysis confirms the presence of Fe and Sn and O in the films. The magnetic measurements were carried out using vibrating sample magnetometer and found that the strength of magnetization decreased with increase of annealing temperature. © 2016 Author(s).
About the journal
JournalAIP Conference Proceedings
PublisherAuthor(s)
ISSN0094243X
Open Access0