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Impedometric anion sensing behaviour of In x Ga 1 - X N films grown by modified activated reactive evaporation
, K.P. Biju, M.K. Jain
Published in Elsevier B.V.
2011
Volume: 258
   
Issue: 5
Pages: 1744 - 1749
Abstract
In the present work, In x Ga 1 - x N films with different indium compositions (x = 0.88, 0.63, 0.36 and 0.18) were prepared on glass substrates using a commercially viable technique known as modified activated reactive evaporation. Electrochemical impedance was used to investigate the anion sensing properties of these films for KCl, KI and KNO 3 salt solutions of different molar concentrations. The anion sensing behaviour of InGaN films is attributed to the presence of high n-type background carrier concentration and positively charged surface donor states. The InGaN based anion sensors were found to have good sensitivity with faster response and recovery time. The film with x = 0.63 was found to have the highest sensitivity for all the anions due to the presence of more active surface area together with large number of surface donor states. © 2011 Elsevier B.V. All rights reserved.
About the journal
JournalData powered by TypesetApplied Surface Science
PublisherData powered by TypesetElsevier B.V.
ISSN01694332