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Investigation of Radiation Hardened TFET SRAM Cell for Mitigation of Single Event Upset
M. Pown,
Published in Institute of Electrical and Electronics Engineers Inc.
Volume: 8
Pages: 1397 - 1403
This study analyzes the soft error sensitivity of SRAM cell which employs double-gate tunnel field effect transistor (DG TFET). The mitigation technique for the data recovery after the heavy ion strike is discussed. The conventional 6T TFET SRAM cell is designed using DG TFET of 30 nm. For the circuit simulation, the symbol of DG TFET is developed with the help of a look-up table based Verilog-A code. The radiation induced single event upset (SEU) causes a change in the stored data of SRAM cell. In order to improve the SEU sensitivity, the radiation hardening-by-design technique (RHBD) is introduced in 6T TFET SRAM cell by connecting the RC feedback loop between the two cross coupled inverters. The standby power of the TFET SRAM cell is calculated and compared before and after the radiation mitigation technique insertion. © 2013 IEEE.
About the journal
JournalData powered by TypesetIEEE Journal of the Electron Devices Society
PublisherData powered by TypesetInstitute of Electrical and Electronics Engineers Inc.