The magneto-dielectric response in multiferroic ZnFe2O4/PMN-PT bilayer thin films prepared on a glass substrate using RF magnetron sputtering has been investigated in this work. PMN-PT thin films (i.e. PMN-PT/LCMO/Pt/Ti/glass) deposited on glass were used as a substrate for deposition of ZnFe2O4 thin films. ZnFe2O4 thin films were annealed ex situ at different temperatures. Structural, magnetic, ferroelectric, dielectric and magneto-dielectric studies were carried out on these multiferroic bilayer thin films. Structural studies revealed the presence of each layer in its respective single phase. Magnetic and ferroelectric studies revealed the ferromagnetic and ferroelectric behaviors of these bilayers. To quantify the magnetoelectric coupling, the dielectric constant of the bilayer was measured at room temperature as a function of frequency with and without the applied magnetic field. The magneto-dielectric response MD(%) was calculated by finding the relative change in dielectric constant at 1 kHz as a percentage. The observed MD response was correlated with magnetization of the ferrite layer. An MD response of 2.60% was found for a bilayer film annealed at 350 °C. At this particular annealing temperature, the ZnFe2O4 layer also has the highest saturation magnetization of 1900 G. © 2016 IOP Publishing Ltd.