Lead oxide sample was prepared at low temperature by the solvo-thermal method. The lead oxide samples were characterized by X-ray diffraction (XRD), FT-IR and transmission electron spectroscopy (TEM) were employed to identify the structural phases, vibrational stretching frequencies and particle nature. X-ray diffraction studies indicate the formation of stable crystalline phase at 75 °C. Transmission electron microscopy and selected area electron diffraction analysis confirms the crystalline nanorods of lead oxide of size 15 - 30 nm. The results of dielectric measurements as a function of frequency, temperature and Cole - Cole plots are reported.