Engineers are searching for a reliable method to determine the time-to-failure (TTF) data of the electronic systems as cheaper as possible. Reliability plays a vital role in electronic devices marketing & sales, product quality, etc. Accelerated Life Test (ALT) and Highly Accelerated Life Testing (HALT) are the latest methodology in the field of life testing of engineering systems. The ALT can be conducted at higher stress level to generate more failure data within short duration of time. The parametric method and non-parametric method are used to convert the accelerated test condition to actual condition. In this paper, the most widely used C0G and X7R nano ceramic capacitor is selected to generate the time-to failure data at accelerated condition and non-parametric method is used to convert the accelerated condition data into actual condition. © 2016 Elsevier Ltd. All rights reserved.