Publications - 43Publications - 43
Publications - 43Publications (43)
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ArticlesA physics-based single event transient pulse width model for cmos vlsi circuits2020 | Institute of Electrical and Electronics Engineers Inc.
ArticlesSensitivity of SET Pulse-Width and Propagation to Radiation Track Parameters in CMOS Inverter Chain2020 | Taylor and Francis Ltd
ArticlesA physics-based model for LER-induced threshold voltage variations in double-gate MOSFET2020 | Springer
ArticlesDual-summed flipped voltage follower LDO regulator with active feed-forward compensation2020 | Elsevier GmbH- ArticlesA Cap-less Voltage Spike Detection and Correction Circuit for Low Dropout Regulator2020 | World Scientific
- ArticlesA push-pulled capacitor-less FVF LDO with active feed-forward compensator2020 | Taylor and Francis Ltd.
- Journal ArticleDiscovery, synthesis and molecular substantiation of N-(benzo[d]thiazol-2-yl)-2-hydroxyquinoline-4-carboxamides as anticancer agents2019 | Elsevier BV
- Journal ArticleAnalysis of bipolar amplification due to heavy-ion irradiation in 45 nm FDSOI MOSFET with thin BOX and ground plane2019 | Elsevier BV
- Journal ArticleAn Analytical Model of Single-Event Transients in Double-Gate MOSFET for Circuit Simulation2019 | Institute of Electrical and Electronics Engineers (IEEE)
- Journal ArticleA physics-based 3-D potential and threshold voltage model for undoped triple-gate FinFET with interface trapped charges2019 | Springer Science and Business Media LLC
- Journal ArticleAnalytical Model for RDF-Induced Threshold Voltage Fluctuations in Double-Gate MOSFET2019 | Institute of Electrical and Electronics Engineers (IEEE)
- Book ChapterDesign and Optimization of Double-Gate MOSFET to Reduce the Effects of Single Event Transients2019 | Springer International Publishing
- Journal ArticleA Descriptive Study of Customer’s Opinions on Factors Influencing Purchasing Decisions in Corporate Retail Stores in a City of Vijayawada.2018 | Science Publishing Corporation
Open Access - Journal ArticleAnalytical model of hot carrier degradation in uniaxial strained triple-gate FinFET for circuit simulation2018 | Springer Science and Business Media LLC
- ConferencesStudy of Line Edge Roughness Induced Threshold Voltage Fluctuations in Double-Gate MOSFET2018 | Institute of Electrical and Electronics Engineers Inc.
- ConferencesHot Carrier Reliability in 45 nm Strained Si/relaxed Si1-xGex CMOS Based SRAM Cell2018 | Institute of Electrical and Electronics Engineers Inc.
- Journal ArticleWidening and narrowing of time interval due to single-event transients in 45 nm vernier-type TDC2017 | Institution of Engineering and Technology (IET)
